[1] Dalcanton, J. J. 18 years of science with the Hubble Space Telescope. Nature, 457 , 41-50(2009).
[2] De Groot, P. J., Deck, L. L., Su, R. & Osten, W. Contributions of holography to the advancement of interferometric measurements of surface topography. Light: Advanced Manufacturing 3, 258-277 (2020).
[3] Malacara, D. in Optical Shop Testing 1st edu, Ch. 3(Mallick, S. , Malacara, D. , 2006
[4] An, Q. C., Zhang, H. F., Wang, K., Liu, X. Y. & Li, H. W. Photonics Scanning Pentaprism System for the Integrated Inspection of Large-Aperture Telescopes. Sensors 23, 6650 (2023). doi: 10.3390/s23156650
[5] Young, C. V., Masse, L., Casey, D. T., MacGowan B. J., Landen, O. L., et al. View factor estimation of hot spot velocities in inertial confinement fusion implosions at the National Ignition Facility. Physics of Plasmas 27, 082702 (2020). doi: 10.1063/5.0009746
[6] Hu, R., Liu, S. T. & Li Q. H. Topology-optimization-based design method of flexures for mounting the primary mirror of a large-aperture space telescope. Applied Optics 56, 4551-4560 (2017). doi: 10.1364/AO.56.004551
[7] Kegelmeyer, L. M., Clark, R., Leach, R. R., McGuigan, D., Kamm, V. M., et al. Automated optics inspection analysis for NIF. Fusion Engineering and Design 87, 2120-2124 (2012). doi: 10.1016/j.fusengdes.2012.09.017
[8] Shimura, K., Nakai, N., Taniguchi, K. & Itoh, M. Simple and accurate optical height sensor for wafer inspection systems. Optical Review 23, 1-9 (2016). doi: 10.1007/s10043-015-0160-z
[9] Kalirai, J. Scientific discovery with the James Webb Space Telescope. Contemporary Physics 5, 251-290 (2018).
[10] De Groot, P. J. A review of selected topics in interferometric optical metrology. Reports On Progress In Physics 82, 056101 (2019). doi: 10.1088/1361-6633/ab092d
[11] Qiu, L. R. , Su, Y. H. , Xu, K. M. , Cui, H. , Zheng, D. Z. , et al. A high-precision multi-dimensional microspectroscopic technique for morphological and properties analysis of cancer cell. Light: Science & Applications 12 , 129(2023).
[12] Feng, P., Lu, X. Y., Dong, B., Ma, X. C. & Xiao, W. Subaperture stitching interferometry based on digital holography. Optics and Lasers in Engineering 86, 228-235 (2016). doi: 10.1016/j.optlaseng.2016.06.012
[13] Liu, Y. M., Hu, Y., Zhang, S. H., Huang, S., Li, J. P., et al. Virtual-real combination Ritchey-Common interferometry. Optics Express 30, 15777-15795 (2022). doi: 10.1364/OE.457704
[14] Kredba, J., Psota, P., Stašík, M., Lédl, V., Veselý, L., et al. Absolute interferometry for fast and precise radius measurement. Optics Express 29, 12531-12542 (2021). doi: 10.1364/OE.420372
[15] Silin, D. E., Kozhevatov, I. E., Kulikova, E. H., Pigasin, A. V., Speransky, S. B., et al. The Design and Characteristics of a 630-mm Phase-Shifting Interferometer. Instruments and Experimental Techniques 61, 393-399 (2018). doi: 10.1134/S0020441218020215
[16] Lim, J., Choi, H. & Park, N. C. Phase-shift digital holography using multilayer ceramic capacitor actuators. Optics and Lasers in Engineering 156, 107080 (2022). doi: 10.1016/j.optlaseng.2022.107080
[17] Zhu, Y., Chen, J. B., Zhu, R. H. & Gao, Z. S. Self-calibrating for phase-shifting adapter consisting of three PZT. Acta Optica Sinica 21, 468-471 (2001).
[18] Ouyang, Y., Ou-Yang, M. & Chou, H. C. Self-calibration of a phase-shifting adapter for Fizeau interferometers. Optical Review 16, 495-499 (2009). doi: 10.1007/s10043-009-0097-1
[19] Okada, K., Sakuta, H., Ose, T. & Tsujiuchi, J. Separate measurements of surface shapes and refractive index inhomogeneity of an optical element using tunable-source phase shifting interferometry. Applied Optic 29, 3280-3285 (1990). doi: 10.1364/AO.29.003280
[20] De Groot, P. Measurement of Transparent Plates with Wavelength-Tuned Phase-Shifting Interferometry. Applied Optics 39, 2658-2663 (2000). doi: 10.1364/AO.39.002658
[21] Chang, L. & Yu, Y. J. Wavelength-tuning phase-shifting interferometry of transparent plates using sub-signal frequency correction. Measurement 205, 112157 (2022). doi: 10.1016/j.measurement.2022.112157
[22] Zhu, W. H. , Chen, L. , Yang, Y. , Zhang, R. , Zheng D. H. , et al. 600-mm aperture simultaneous phase-shifting Fizeau interferometer. Optics & Laser Technology 104 , 26-32(2018).
[23] Kim, Y., Hibino, K. & Mitsuishi, M. Interferometric profile measurement of optical-thickness by wavelength tuning with suppression of spatially uniform error. Optics Express 26, 10870-10878 (2018). doi: 10.1364/OE.26.010870
[24] Hibino, K., Hanayama, R., Burke, J. & Oreb, B. F. Tunable phase-extraction formulae for simultaneous shape measurement of multiple surfaces with wavelength-shifting interferometry. Optics Express 12, 5579-5594 (2004). doi: 10.1364/OPEX.12.005579
[25] Yu, H., Aleksoff, C. & Ni, J. Thickness measurement of transparent plates by wavelength stepping and a phase unwrapping algorithm. Measurement Science and Technology 24, 075201 (2013). doi: 10.1088/0957-0233/24/7/075201
[26] Kim, Y., Hibino, K., Sugita, N. & Mitsuishi, M. Measurement of absolute optical thickness of mask glass by wavelength-tuning Fourier analysis. Optics. Letters 40, 3169-3172 (2015). doi: 10.1364/OL.40.003169
[27] Kim, Y., Hibino, K. & Mitsuishi, M. Interferometric profile measurement of optical-thickness by wavelength tuning with suppression of spatially uniform error. Optics express 26, 10870-10878 (2018). doi: 10.1364/OE.26.010870
[28] Tang, L., Qiu, L. R., Yang, S., Cui, H. & Zhao, W. Q. High-precision phase-shift method for heavy-load reference mirror based on capacitance sensor monitoring. Measurement 223, 113761 (2023). doi: 10.1016/j.measurement.2023.113761
[29] Cao, B. X., Hoang, P. Le., Ahn, S., Kim, Jeng-o, Kang, Heeshin., et al. Measurement of focal length based on laser-beam-spot tracking system using diffractive beam sampler. Measurement 122, 135-140 (2018).
[30] Luo, J., Bai, J., Zhang, J. C., Hou, C. L., Wang, K. W. & Hou, X. Y. Long focal-length measurement using divergent beam and two gratings of different periods. Optics express 22, 27921-27931 (2014). doi: 10.1364/OE.22.027921
[31] Tao, W., Zhong, H., Chen, X., Selami, Y. & Zhao, H. A new fitting method for measurement of the curvature radius of a short arc with high precision. Measurement Science and Technology 29, 075014 (2018). doi: 10.1088/1361-6501/aac22e
[32] DeBoo, B. & Sasian, J. Precise focal-length measurement technique with a reflective Fresnel-zone hologram. Applied Optics 42, 3903-3909 (2003). doi: 10.1364/AO.42.003903
[33] Yang, Z. M., Wang, K. L., Cheng, J. L., Gao, Z. S. & Yuan, Q. Large radius of curvature measurement based on virtual quadratic Newton rings phase-shifting moiré-fringes measurement method in a nonnull interferometer. Applied Optics 55, 4769-4775 (2016). doi: 10.1364/AO.55.004769
[34] Chatterjee, S. & Kumar, Y. P. Measurement of surface profile of a long-radius optical surface with wedge phase shifting lateral shear interferometer. Optical Engineering 49, 103602 (2010). doi: 10.1117/1.3491205
[35] Selberg, L. A. Radius measurement by interferometry. Optical Engineering 31, 1961-1966 (1992). doi: 10.1117/12.59905
[36] Schmitz, T. L., Evans, C. J., Davies, A. & Estler, W. T. Displacement Uncertainty in Interferometric Radius Measurements. CIRP Annals 51, 451-454 (2002). doi: 10.1016/S0007-8506(07)61558-3
[37] Zhao, W. Q., Li, Z. G., Qiu, L. R., Ren, H. & Shao, R. J. Large-aperture laser differential confocal ultra-long focal length measurement and its system. Optics express 23, 17379-17393 (2015). doi: 10.1364/OE.23.017379
[38] Li, Z. G., Qiu, L. R., Zhao, W. Q. & Yang, S. Laser differential confocal ultra-large radius measurement for convex spherical surface. Optics Express 24, 19746-19759 (2016). doi: 10.1364/OE.24.019746
[39] Malacara, D. , Servín, M. , & Malacara, Z. (eds. ) Interferogram Analysis for Optical Testing (CRC Press, 2018).
[40] Yang, J. M., Qiu, L. R., Zhao, W. Q. & Wu, H. L. Laser differential reflection-confocal focal-length measurement. Optics Express 20, 26027-26036 (2012). doi: 10.1364/OE.20.026027